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  1. SUSS ProbeShield® Technology - Home

    ProbeShield Technology from SUSS MicroTec is the solution for highly accurate device characterization and reliability test of semiconductor devices.
    modeling3
    test system1
    WLR1
    semiconductor test1
    probe station1
    Wafer level1
    wafer probing1
    wafer test1
    device characterization1
    parametric test1
    on wafer0
    probe system0
    wafer level reliability0

    www.probeshield.com - 2009-02-09

  2. Pintail Technologies

    Services | Customers | Partners | News & Events | Customer Login | Contact Us Product Overview Data Analysis Solutions Real-time Data Dashboard Device ...
    feedback2
    realtime2
    real-time2
    PAT2
    real time2
    AEC1
    yield1
    regression1
    backend1
    characterization1
    NPI1
    binning1
    outlier1
    dynamic test1
    device characterization1
    DPAT1
    outlier detection1
    adaptive test1
    feed-forward1
    real-time test1
    static test1
    dynamic PAT1
    outlier binning1
    part average testing1
    parts average testing1
    real-time binning1
    realtime binning1
    static PAT1
    statistical binning1
    yield learning1
    yield ramp1

    www.pintail.com - 2009-02-05

  3. CPiDR High Power High Frequency Amplifier by Ktech

    CPiDR High Power High Frequency Amplifier – MEMS / NEMS device characterization. 24W, 1MHz bandwidth … best in class! Manufactured by Ktech, the industry l ...
    test3
    laboratory2
    nanotechnology2
    spider2
    MEMS1
    high power1
    high frequency1
    NEMS1
    microelectromechanical1
    Widowmaker1
    Sandia National Laboratories1
    24W1
    Hi-Power1
    device characterization1
    1 MHz1
    Hi-Frequency1
    24 Watts0
    Amplifier Microsystems0
    CPiDR0
    Laboratory Amplifier0
    MEMS characterization0
    MEMS Laboratory Amplifier0
    Microsystems Amplifier0

    www.ktechproducts.com - 2009-02-04

keywords4 embedded2 pat2 real time2 real-time2 electrical3 business7 realtime2 online7 more3

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